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Alexander Dipl Phys Ruf
Alexander Dipl Phys Ruf
Carl Zeiss AG
Materials science
Cantilever
Atomic force microscopy
Analytical chemistry
Thin film
8
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39
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Integrated Fabry–Pérot distance control for atomic force microscopy
1997
Journal of Vacuum Science & Technology B
Alexander Dipl Phys Ruf
Michael Abraham
J Diebel
Wolfgang Ehrfeld
Peter Güthner
Manfred Lacher
Karsten Mayr
J. Reinhardt
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Citations (8)
Ultra-long glass tips for atomic force microscopy
1996
Journal of Micromechanics and Microengineering
Alexander Dipl Phys Ruf
J Diebel
Michael Abraham
Thomas R. Dr. Dietrich
Manfred Lacher
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Citations (14)
A process for producing a metallic scanning device for the combined examination of electronic, magnetic and topographical structures with resolution in the submicron range
1995
Alexander Dipl Phys Ruf
Michael Abraham
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A Miniaturised Fabry Perot AFM Sensor
1995
Alexander Dipl Phys Ruf
Michael Abraham
Manfred Lacher
Karsten Mayr
Thomas Zetterer
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Citations (1)
Photoetchable glass for microsystems: tips for atomic force microscopy
1993
Journal of Micromechanics and Microengineering
Thomas R. Dr. Dietrich
Michael Abraham
J Diebel
Manfred Lacher
Alexander Dipl Phys Ruf
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Citations (16)
Sensor head and process for its preparation
1993
Alexander Dipl Phys Ruf
Michael Abraham
Manfred Lacher
Thomas Zetterer
Thomas R. Dr. Dietrich
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