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I. Emesh
I. Emesh
Materials science
Metallurgy
Composite material
Laser
Thin film
3
Papers
9
Citations
0.02
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2024
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Thickness measurement for Cu and Ta thin films using optoacoustics
2000
IITC | International Interconnect Technology Conference
Michael Gostein
T. C. Bailey
I. Emesh
A. C. Diebold
Alexei Maznev
Matthew J. Banet
Michael Joffe
Robin Anne Sacco
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Citations (3)
TEOS-Based Oxides: Deposition Dependent Properties
1993
Materials Science Forum
M. Saran
I. Emesh
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Citations (4)
Characterization of silicon oxide films deposited using tetraethylorthosilicate
1989
Canadian Journal of Physics
M. Simard-Normandin
I. Emesh
G. D'asti
A. C. de Wilton
N Pearce
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Citations (2)
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