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Kwame Eason
Kwame Eason
KLA-Tencor
Silicon
Analytical chemistry
Gate dielectric
Dielectric
Plasma
2
Papers
10
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In-Line Copper Contamination Monitoring Using Noncontact Q VSPV Techniques
2005
Journal of The Electrochemical Society
Matthias Boehringer
Johann Hauber
Sophie Passefort
Kwame Eason
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Citations (9)
In-line electrical characterization of ultrathin gate dielectric films
2002
ASMC | Advanced Semiconductor Manufacturing Conference
F.N. Cubaynes
Sophie Passefort
Kwame Eason
Xiafang Zhang
Lucien Date
Didier Pique
Thierry Conard
Aude Rothschild
Marc Schaekers
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Citations (1)
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