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C. S. Fu
C. S. Fu
MediaTek
Electronic engineering
Ring oscillator
Chip
Voltage
Engineering
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Fast chip aging prediction by product-like VMIN drift characterization on test structures
2018
IRPS | International Reliability Physics Symposium
Shiu-Wei Liu
G. Y. Chen
Min-Hui Chen
David Yen
Wuan Kuo
C. S. Fu
Y. S. Tsai
M. Z. Lin
Y-H. Fang
M. J. Lin
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