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Crispin J.D. Hetherington

National Center for Electron Microscopy

19

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160

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Sub-Ångstrom Resolution with a Mid-Voltage TEM

2004 Microscopy Today
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Laboratory design for high-performance electron microscopy

2004 Microscopy Today
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Installing and operating FEGTEMs

1997 Lawrence Berkeley National Laboratory
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Installing and operating FEGTEMs

1997 Lawrence Berkeley National Laboratory
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A technique for measuring small atomic displacements in HREM images

1990
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Hrem of Defects in Silicon at Twin Intersections

1990 MRS Proceedings
- Crispin J.D. Hetherington
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Simulation of High Resolution Images of Wedge-Shaped Crystals

1989
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HREM of twin intersections in Silicon

1989
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Simulated Image Maps for Use in Experimental High-Resolution Microscopy

1989
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The Berkeley Atomic Resolution Microscope – an Update

1989 MRS Proceedings
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Citations (13)