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Felice Russo
Felice Russo
Micron Technology
Getter
Impurity
Electronic engineering
CMOS
Contamination
4
Papers
41
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Proximity gettering of slow diffuser contaminants in CMOS image sensors
2014
Solid-state Electronics
Felice Russo
Giuseppe Moccia
Giancarlo Nardone
R. Alfonsetti
G. Polsinelli
A. D’Angelo
A. Patacchiola
Massimo Liverani
P. Pianezza
T. Lippa
M. Carlini
M.L Polignano
I. Mica
E. Cazzini
Monica Ceresoli
D. Codegoni
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Citations (37)
Forecast of CMOS Imagers Yield Learning by the Gompertz Model
2013
IEEE Transactions on Semiconductor Manufacturing
Paolo Organtini
Felice Russo
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Citations (3)
Proximity Gettering of Slow Diffuser Contaminants
2013
Solid State Phenomena
Maria Luisa Polignano
Isabella Mica
Elena Cazzini
Monica Ceresoli
Davide Codegoni
Felice Russo
Giuseppe Moccia
Giancarlo Nardone
Roberto Alfonsetti
Giampaolo Polsinelli
Antonio Domenico D'Angelo
Antonio Patacchiola
Massimo Liverani
Pio Pianezza
Tiberio Lippa
Michele Carlini
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Citations (1)
A Pattern Recognition Tool for Automatic Etch Process Quality Check
2008
ASMC | Advanced Semiconductor Manufacturing Conference
Stefano Russo
Felice Russo
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