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O. Haeberlen

Infineon Technologies

5

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Degradation Mechanisms of GaN HEMTs With p-Type Gate Under Forward Gate Bias Overstress

2018 IEEE Transactions on Electron Devices
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{S}canning {M}icrowave {M}icroscopy for {E}lectronic {D}evice {A}nalysis on {N}anometre {S}cale

2016 Microelectronics Reliability
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Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale

2016 Microelectronics Reliability
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