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N. Hofmeester
N. Hofmeester
Gas cluster ion beam
Surface roughness
Silicon on insulator
Spectral density
Spatial frequency
2
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1
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Gas cluster ion beam processing equipment
2002
J. Bachand
A. Freytsis
E. Harrington
Matthew C. Gwinn
N. Hofmeester
John J. Hautala
Michael E Mack
K. Regan
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SOI uniformity and surface smoothness improvement using GCIB processing
2002
Optometry - Journal of The American Optometric Association
L.P Allen
Stephen Maynard Caliendo
N. Hofmeester
Ellen M. Harrington
M. J. Walsh
M. Tabat
Thomas G. Tetreault
E. Degenkolb
C. Santeufemio
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