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SOI uniformity and surface smoothness improvement using GCIB processing
SOI uniformity and surface smoothness improvement using GCIB processing
2002
L.P Allen
Stephen Maynard Caliendo
N. Hofmeester
Ellen M. Harrington
M. J. Walsh
M. Tabat
Thomas G. Tetreault
E. Degenkolb
C. Santeufemio
Keywords:
Surface roughness
Silicon on insulator
Spectral density
Spatial frequency
Smoothness
Medicine
Gas cluster ion beam
Optics
Correction
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