Old Web
English
Sign In
Acemap
>
authorDetail
>
Muqian Niu
Muqian Niu
Tianjin University
Infrasound
Optoelectronics
hot carrier degradation
Stress (mechanics)
Materials science
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Impact of RF Stress on the Low-Frequency Noise in nMOSFETs
2021
IEICE Electronics Express
Haipeng Fu
Muqian Niu
Liping Yang
Xuguang Li
Kaixue Ma
Show All
Source
Cite
Save
Citations (0)
1