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Impact of RF Stress on the Low-Frequency Noise in nMOSFETs
Impact of RF Stress on the Low-Frequency Noise in nMOSFETs
2021
Haipeng Fu
Muqian Niu
Liping Yang
Xuguang Li
Kaixue Ma
Keywords:
Infrasound
Optoelectronics
hot carrier degradation
Stress (mechanics)
Materials science
Correction
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