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Dong-Ryul Lee
Dong-Ryul Lee
Pohang University of Science and Technology
Optics
X-ray reflectivity
Physics
Thin film
Sapphire
3
Papers
13
Citations
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Characterization of Buried Ultrathin Layer and Multilayer System by X-Ray Scattering
2002
Japanese Journal of Applied Physics
Gi-Hong Rue
Joung Young Sug
Su-Ho Lee
Ki Bong Lee
Dong-Ryul Lee
Dae-Hwang Yoo
Tae-Bong Hur
Yoon-Hwae Hwang
Hyung-Kook Kim
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Structures of nitridated layers on sapphire studied by x-ray reflectivity and diffraction
2000
Applied Physics Letters
Ki-Sung Kim
Seon-Hyo Kim
Dong-Ryul Lee
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Citations (11)
Diffuse X-Ray Reflectivity Study of Interface Roughness in Mo/Si Multilayers
1999
Japanese Journal of Applied Physics
Dong-Ryul Lee
Young-Ju Park
Young Hun Jeong
Ki Bong Lee
H Takenaka
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Citations (1)
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