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Gf Giel Bastin

Eindhoven University of Technology

79

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Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam

2006 Journal of Microscopy
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Citations (1)
Experimental determination of the surface ionisation in electron probe microanalysis

2003 Materials Chemistry and Physics
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The diffusion couple technique in phase diagram determination

2001 Journal of Alloys and Compounds
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Citations (147)
An experimental approach to the determination of the surface ionization φ(0) in electron probe microanalysis

2001 X-Ray Spectrometry
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Citations (4)
Extension of PROZA96 to conditions of non-perpendicular incidence of the electron beam.

2001 X-Ray Spectrometry
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Citations (7)
Quantitative electron probe microanalysis of boron

2000 Journal of Solid State Chemistry
- Gf Giel Bastin
- Hjm Hans Heijligers
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Citations (25)
A systematic database of thin‐film measurements by EPMA Part II—Palladium films

2000 X-Ray Spectrometry
- Gf Giel Bastin
- Hjm Hans Heijligers
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Citations (19)
PROZA96: An improved matrix correction program for electron probe microanalysis, based on a double Gaussian phi(rz) approach

1998 X-Ray Spectrometry
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Citations (58)
Quantitative EPMA for the ultralight elements boron through oxygen

1992
- Gf Giel Bastin
- Hjm Hans Heijligers
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Quantitative electron probe microanalysis of multilayer structures

1992
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