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Michael Kotelyanskii

Max Planck Society

37

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443

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Non-destructive acoustic metrology and void detection in 3×50μm TSV

2016 ASMC | Advanced Semiconductor Manufacturing Conference
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A New In-line Laser-based Acoustic Technique for Pillar Bump Metrology

2015 Journal of microelectronics and electronic packaging
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Non-Destructive Acoustic Metrology for Void Detection in Tsv's

2014 Advanced Semiconductor Manufacturing Conference
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Ellipsometry studies of the optical phonons in hexagonal manganites $R$MnO$_{3}$

2014 Bulletin of the American Physical Society
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Infrared-active Optical Phonons and Magnetic Excitations in the Hexagonal Manganites RMnO3 (R = Ho, Er, Tm, Yb, and Lu)

2014 Physical Review B
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Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability.

2013 Review of Scientific Instruments
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Muller matrix ellipsometry of dynamic magnetoelectric effects in multiferroics

2013 Bulletin of the American Physical Society
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Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

2011 Thin Solid Films
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Mueller matrices for anisotropic metamaterials generated using 4 × 4 matrix formalism

2011 Thin Solid Films
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Modeling of electromagnetic wave propagation and spectra of optical excitations in complex media using 4x4 matrix formalism

2011 arXiv: Optics
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