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S. Pazos
S. Pazos
National Scientific and Technical Research Council
Electronic engineering
Oxide
Chemistry
Metal gate
Stress field
1
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5
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Temperature dependence of trapping effects in metal gates/Al2O3/InGaAs stacks
2017
Solid-state Electronics
Felix Palumbo
S. Pazos
F. Aguirre
Roy Winter
Igor Krylov
M. Eizenberg
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Citations (5)
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