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Steven Vandeweghe

ON Semiconductor

4

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Polysilicon Fuse Electrical Voiding Mechanism AP/DFM: Advanced Patterning / Design for Manufacturability

2020 ASMC | Advanced Semiconductor Manufacturing Conference
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GaN-based MIS-HEMTs: Impact of cascode-mode high temperature source current stress on NBTI shift

2017 IRPS | International Reliability Physics Symposium
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(Invited) intrinsic reliability assessment of 650V rated AlGaN/GaN based power devices: an industry perspective

2016
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Citations (18)