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Neo Soh Ping

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Failure analysis on non-visible front-end defects in deep NWELL implantation related process

2013 IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
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A Comprehensive Analysis Methodology for Gate Oxide Integrity Failure Using Combined FA Techniques

2011
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The application of pattern correlation method between maps of failure bins and electrical parameters in fault isolation

2001 IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
- Luo Chang Ping
- Neo Soh Ping
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