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A Comprehensive Analysis Methodology for Gate Oxide Integrity Failure Using Combined FA Techniques
A Comprehensive Analysis Methodology for Gate Oxide Integrity Failure Using Combined FA Techniques
2011
Hua Younan
Nistala Ramesh Rao
Chen Shuting
Zhu Lei
Chia Chin Ning
Zhang Jianming
Huang Yanhua
Neo Soh Ping
Keywords:
Optoelectronics
Materials science
Gate oxide
Correction
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