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C. Russ
C. Russ
Technische Universität München
Engineering
Integrated circuit
Electronic engineering
Equivalent circuit
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6
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72
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ESD protection elements during hbm stress tests—further numerical and experimental results
1995
Quality and Reliability Engineering International
C. Russ
Horst Gieser
Koen Verhaege
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Citations (18)
Analysis of HBM ESD testers and specifications using a fourth‐order lumped element model
1994
Quality and Reliability Engineering International
Koen Verhaege
Philippe Roussel
Guido Groeseneken
Herman Maes
Horst Gieser
C. Russ
P. Egger
Xaver Guggenmos
F.G. Kuper
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Citations (10)
Analysis of HBM ESD testers and specifications using a fourth-order lumped element model
1994
Koen Verhaege
Philippe Roussel
Guido Groeseneken
Herman Maes
Horst Gieser
C. Russ
P. Egger
Xaver Guggenmos
F.G. Kuper
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Compact electro-thermal simulation of ESD-protection elements
1994
C. Russ
H. Gieser
P. Egger
S. Irl
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Citations (21)
Compact electro-thermal simulation of ESD-protection elements
1994
Quality and Reliability Engineering International
C. Russ
H. Gieser
P. Egger
S. Irl
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Citations (22)
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