Old Web
English
Sign In
Acemap
>
authorDetail
>
T.J Eom
T.J Eom
Inha University
Diode
Secondary ion mass spectrometry
Leakage (electronics)
Deep-level transient spectroscopy
p–n junction
1
Papers
4
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Reverse recovery characteristics and defect distribution in an electron-irradiated silicon p–n junction diode
2004
Materials Chemistry and Physics
S.M Kang
T.J Eom
S.J Kim
H W Kim
J.Y Cho
Chongmu Lee
Show All
Source
Cite
Save
Citations (4)
1