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Zhao Yong Atman
Zhao Yong Atman
Reliability engineering
Electronic engineering
Engineering
Computer science
Ongoing reliability test
5
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データマイニング応用を統合したIoTに触発された半導体信頼性試験システム【Powered by NICT】
2016
Tang Tyler Junyao
Chung Andrew
Zhao Yong Atman
Kang Randy
Zhang Mark
Chien Wei-Ting Kary
Jungang Yang
Jie Zhang
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WLR PBTI試験によるH KMG SRAM HTOL性能の初期検出と予測【Powered by NICT】
2016
Microelectronics Reliability
Chien Wei-Ting Kary
Zhao Yong Atman
Zhu Yueqin
Song Yongliang
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28nm HfO_2~ベースH KMG MOSFETのNBTI性能に及ぼすI/O酸化プロセスの影響【Powered by NICT】
2016
Microelectronics Reliability
Chien Wei-Ting Kary
Zhu Yueqin
Song Yongliang
Zhao Yong Atman
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THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY
2013
International Journal of Reliability, Quality and Safety Engineering
Wei-Ting Kary Chien
Zhao Yong Atman
Venson Chang
Jeff Wu
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エレクトロマイグレーション加速試験モデルのパラメータ分析とその動向に関する研究【JST・京大機械翻訳】
2009
Chien Wei-Ting Kary
Zhao Yong Atman
Chang Venson
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