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Nahuel A. Muller

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5

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Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.

2019 IRPS | International Reliability Physics Symposium
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MicroPIXE analysis of removal of aqueous U(VI) by S. intermedia and P. stratiotes in the presence of Th(IV)

2019 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Outstanding reliability of heavy ion irradiated AlInN/GaN on silicon HFETs

2019 IEEE Transactions on Nuclear Science
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Experimental Setup of the Fast Current Controller for the Buenos Aires Heavy Ion Microbeam

2019
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