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Shin-ichi Suzuki
Shin-ichi Suzuki
University of Tokyo
Electronic engineering
Insulated-gate bipolar transistor
Optoelectronics
Logic gate
MOSFET
3
Papers
19
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0
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2024
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Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process
2018
The Japan Society of Applied Physics
Hiroto Kobayashi
Ryo Yokogawa
Takahiro Suzuki
Yoichiro Numazawa
Atsushi Ogura
Shinichi Nishizawa
Takuya Saraya
Kazuo Ito
T. Takakura
Shin-ichi Suzuki
M. Fukui
Kiyoshi Takeuchi
Toshiro Hiramoto
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Measurement of IGBT trench MOS-gated region characteristics using short turn-around-time MOSFET test structures
2018
ICMTS | International Conference on Microelectronic Test Structures
Kiyoshi Takeuchi
M. Fukui
Takuya Saraya
Kazuo Itou
Shin-ichi Suzuki
T. Takakura
Toshiro Hiramoto
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Experimental verification of a 3D scaling principle for low V ce(sat) IGBT
2016
IEDM | International Electron Devices Meeting
Kuniyuki Kakushima
Takuya Hoshii
Kazuo Tsutsui
Akira Nakajima
Shinichi Nishizawa
Hitoshi Wakabayashi
Iriya Muneta
Kazuki Sato
Tomoko Matsudai
Wataru Saito
T. Saraya
K. Itou
M. Fukui
Shin-ichi Suzuki
Masaharu Kobayashi
T. Takakura
Toshiro Hiramoto
Atsushi Ogura
Y. Numasawa
Ichiro Omura
Hiromichi Ohashi
Hiroshi Iwai
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Citations (19)
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