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R. Tamura
R. Tamura
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Magnetoresistive random-access memory
memory test
Chip
Electronic engineering
Materials science
4
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29
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A novel memory test system with an electromagnet for STT-MRAM testing
2019
NVMTS | Non-Volatile Memory Technology Symposium
R. Tamura
N. Watanabe
H. Koike
H. Sato
Shinji Ikeda
Tetsuo Endoh
Soshi Sato
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A novel memory test system with an electromagnet for STT-MRAM testing
2019
R. Tamura
N. Watanabe
H. Koike
H. Sato
S. Ikeda
Tetsuo Endoh
Soshi Sato
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14ns write speed 128Mb density Embedded STT-MRAM with endurance>10 10 and 10yrs retention@85°C using novel low damage MTJ integration process
2018
IEDM | International Electron Devices Meeting
H. Sato
Hiroaki Honjo
T. Watanabe
Masaaki Niwa
Hiroki Koike
S. Miura
Takashi Saito
Hirofumi Inoue
T. Nasuno
Takaho Tanigawa
Y. Noguchi
T. Yoshiduka
M. Yasuhira
S. Ikeda
S. Y. Kang
T. Kubo
Koji Yamashita
Y. Yagi
R. Tamura
Tetsuo Endoh
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Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system
2018
NVMTS | Non-Volatile Memory Technology Symposium
R. Tamura
I. Mori
N. Watanabe
Hiroki Koike
Tetsuo Endoh
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