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kenzi oka
kenzi oka
inspection method
Artificial intelligence
Computer vision
Computer science
Substrate (electronics)
3
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半導体デバイスの製造方法、検査装置における検査条件出し方法、検査装置の選定方法並びに検査装置およびその方法
2000
Rei Hamamatsu
Yoshio Morishige
Takanori Ninomiya
Hidetoshi Nishiyama
Minoru Noguchi
Kenji Oka
Yoshimasa Oshima
Maki Tanaka
Kenji Watanabe
Tetsuya Watanabe
takanori ninomiya
yosimasa oosima
kenzi oka
yosio morisige
rei hamamatu
kenzi watanabe
tetuya watanabe
maki tanaka
hidetosi nisiyama
minoru noguti
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Inspection condition setting method in the inspection method and apparatus, and inspection system
2000
takanori ninomiya
yosimasa oosima
kenzi oka
yosio morisige
rei hamamatu
kenzi watanabe
tetuya watanabe
maki tanaka
hidetosi nisiyama
minoru noguti
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Inspection method and a manufacturing method of the device and the semiconductor substrate
1997
yasuhiko nakayama
syunzi maeda
mi yosida
kenzi oka
tan maki taira
yukihiro sibata
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