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    An X-ray reflectivity study of the influence of anodic oxidation and annealing on interface structure in quantum well devices
    Colloids and Surfaces A Physicochemical and Engineering Aspects (1999)
    Anthony S. BrownStephen A. HoltDudley CreaghShuai Yuan
    2
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    5
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    10
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    Keywords:
    X-ray reflectivity
    Topics:
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    IOP Conference Series Materials Science and Engineering (2011)
    Krassimir N. StoevKenji Sakurai
    Quick x-ray reflectivity (QXRR) is a new surface examination technique for studying fast processes at the surface and interface of the materials on a nano-scale. The currently available models for classical scanning-type x-ray reflectivity cannot be applied directly to the QXRR simulations. The present article proposes and discusses models for simulation of QXRR measurements of curved samples, which are applicable for analysis of liquid materials.
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