Erratum: “Nanoscale surface electrical properties of aluminum zinc oxide thin films investigated by scanning probe microscopy” [J. Appl. Phys. 104, 114314 (2008)]
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Aluminum Oxide
Scanning Probe Microscopy
Zinc compounds
The development of strategies to measure the properties of materials with nanoscopic dimensions is a necessary but challenging topic in nanoscale science and technology. Here, combinatorial arrays of specially designed test structures are used to quantify the deformation of micro‐ and nanoscale polymer beams in response to well‐defined capillary forces. In the Figure, increasing capillary forces from left to right act on beams 95 nm wide.
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Aluminum Oxide
Zinc compounds
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A general strategy for fabricating a nanoscopic light source based on a novel geometry of highindex- contrast materials is reported on page 2937 by Jianwen Dong, Guowei Yang, and co-workers. The cover image shows that strong luminescence emission from an individual hollow-hexagonal ZnO nanocolumn is confined in the hollow region. These findings represent a step toward the fabrication of nanoscopic light sources.
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Simultaneous mapping of nanoscale topography and surface potential of soft, rough and heterogeneously charged surfaces under physiological conditions.
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Abstract : This conference dealt with an array of scanning probe and other microscopy techniques based on various physical and chemical properties. Some of them are: Scanning Tunneling Microscopy STM, Scanning Electrochemical Microscopy SEM, Scanning Capacitance Microscopy SCM, Scanning Force Microscopy SFM, Atomic Force Microscopy AFM, Magnetic Force Microscopy, Photon STM, Ballistic Electronic Microscopy, Photo Tunneling Microscopy, Evanescent Field Optical Microscopy.
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This chapter contains sections titled: Surface Force Spectroscopy Friction Force Microscopy Shear Modulation Force Microscopy Chemical Force Microscopy (CFM) Pulsed Force Microscopy Colloidal Probe Microscopy Scanning Thermal Microscopy Kelvin Probe and Electrostatic Force Microscopy Conductive Force Microscopy Magnetic Force Microscopy Scanning Acoustic Force Microscopy High-Speed Scanning Probe Microscopy References
Force Spectroscopy
Scanning Probe Microscopy
Scanning Force Microscopy
Scanning thermal microscopy
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Nanoscale fretting can be studied by using scanning probe microscopy (SPM) and a newly proposed “slip index” which provides unified approach to fretting on different scales. Various relevant issues such as production of colloidal probes and SPM calibration will be presented. Partial and gross slip nanoscale fretting tests with displacement amplitude from 5 to 500 nm and normal load from 15 to 28 μN will be described. Experiments show a substantial increase of the friction at the transition from partial to gross slip and a significant difference of damaged surfaces in the two fretting regimes.
Scanning Probe Microscopy
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