Microfabrication of new sensors for scanning probe microscopy

The paper presents a new concept of a micromachined integrated sensor for combined atomic force/near-field optical microscopy. The sensor consists of a microfabricated cantilever with an integrated waveguide and a transparent near-field aperture tip. The fabrication process involves a novel method for the micromachining of optical near-field tips with an aperture diameter of 100 to 200 nm. A simple concept is introduced for the effective light coupling from the cantilever into the tip.