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A S-parameter measurement method for circuit consisting of analog IC and its power supply IC
A S-parameter measurement method for circuit consisting of analog IC and its power supply IC
2018
Sekine Toshikazu
Takahashi Yasuhiro
Maeda Noboru
Fukui Shinji
Ishikawa Yasuyuki
Oyama Ko
Keywords:
Scattering parameters
Electrical engineering
Physics
measurement method
Correction
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