Scattering parameters of E-plane printed opposite fin in waveguide

An analysis of the E-plane printed opposite fin in a waveguide is presented. The current distribution existing on the metal fin is obtained through a variational technique that utilizes the extremization process. The eigenvalue functions derived from the transverse resonance condition are used to include the effects of the dielectric layer. The computed data for a simplified case with Duroid substrate are compared with those obtained by means of the spectral-domain method. Based on the calculated results, a band-reject filter has been designed and tested at Ka-band. Good agreement on the filter response has been observed between theory and measurement. >