The semiconductor memory device and a testing method thereof

Provided is a semiconductor memory device including: first and second SRAM cells; a first hit line pair provided with the first SRAM cell; a second bit line pair provided with the second SRAM cell; a first switch circuit provided between the first bit line pair and the second bit line pair; and a controller that controls the first switch circuit to render the first bit line pair and the second bit line pair conductive, in a case of testing the first SRAM cell.