Reflection spectra and optical constants of quasicrystalline Al-Pd-Re films in the IR region

Optical properties of quasicrystalline Al-Pd-Re films have been investigated in the mid and far IR regions. Films were deposited on sapphire substrates using layer-by-layer ion-plasma sputtering with subsequent vacuum annealing. Reflection spectra have been measured in a wide IR spectral range from 50 to 7500 cm−1. The complex dielectric function of the films was determined from the experimental data by dispersion analysis of the reflection spectra. The frequency dependence of the real part of the optical conductivity was calculated.