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DEVELOPMENT OF AN SCANNING TUNNELING MICROSCOPY-BASED ELECTRON BEAM INDUCED CURRENT (EBIC) MICROSCOPE
DEVELOPMENT OF AN SCANNING TUNNELING MICROSCOPY-BASED ELECTRON BEAM INDUCED CURRENT (EBIC) MICROSCOPE
1996
P. Koschinski
V. Dworak
P. E. West
L.J. Balk
Keywords:
Electron beam-induced current
Electrochemical scanning tunneling microscope
Conventional transmission electron microscope
Scanning probe microscopy
Environmental scanning electron microscope
Microscope
Analytical chemistry
Electron beam-induced deposition
Electron microscope
Materials science
Optoelectronics
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