Advanced Microbeam Analysis for Characterizing Structure of Surface and Interface for Various Material
2015
Keywords:
- Scanning electron microscope
- Metallurgy
- Scanning confocal electron microscopy
- Materials science
- Polymer characterization
- Analytical chemistry
- Scanning ion-conductance microscopy
- Microbeam
- Electron beam-induced deposition
- Electron tomography
- Reflection high-energy electron diffraction
- Conventional transmission electron microscope
- Nanotechnology
- Correction
- Source
- Cite
- Save
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