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Effective Capacitance Area for Pseudo-MOSFET Characterization of Bare SOI Wafers by Split-C(V) Measurements
Effective Capacitance Area for Pseudo-MOSFET Characterization of Bare SOI Wafers by Split-C(V) Measurements
2013
Cristina Fernandez
Noel Rodriguez
A. Ohata
F. Gamiz
S. Cristoloveanu
Keywords:
MOSFET
Silicon on insulator
Analytical chemistry
Wafer
Capacitance
Chemistry
Optoelectronics
effective capacitance
Correction
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