Characterization of p-type cadmium telluride obtained by electrochemical deposition

Thin films of voluntarily undopes cadmium telluride made by an electrochemical deposition method were compositionally and structurally analyzed by Auger electron spectroscopy, electron probe for microanalysis, and x-ray diffraction spectroscopy. The principal experimental variables were substrate nature, electrolyte acidity, and cathodic potential. It has been demonstrated that p-type single-phase materials can be deposited in appropriate experimental conditions. The surface and bulk composition of single-phase materials were determined by AES. The possible sample contamination sources are discussed.