A method to simulate the optical image from far‐field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires

: For a number of applications is crucial to compare the optical microscope image of sub-diffraction particles with the numerically simulated image. For this task, we propose to compute a discrete tridimensional Fourier transform of a sectored far-field data derived from finite-elements scattering simulations. The method is demonstrated by comparing synthetic images with experimental images of nanowires obtained with a total internal reflection microscope.