In situ X-ray characterization of uranium dioxide during flash sintering

Abstract The in situ response of stoichiometric and non-stoichiometric uranium dioxide during flash sintering is examined using high energy X-ray diffraction. Our results show that the onset of flash is driven by an increase in temperature and controlled by the applied field with no evidence of an accumulation of defects. The incubation time, that is the time after the application of the field before the flash occurs, is found to be material specific with hyper-stoichiometric samples requiring lower fields to flash. For low current/voltage fields we quantify very little change in the atomic and microstructure of the different uranium dioxide samples post-flash. Microstructural changes are identified for high fields and currents, where joule heating and sample temperatures are high, resulting in the complete transformation of the U 4 O 9 phase. Our results highlight the usefulness of high energy X-ray characterization in understanding the subtle structural changes that occur during the flash sintering process.