TID performance degradation of high precision, 16-bit analog-to-digital converters

Phil Layton,Gale Williamson,Ed Patnaude,Larry Longden,Chad Thibodeau,Boris Kazak,Clarence Sloan

TID performance degradation of high precision, 16-bit analog-to-digital converters

2003

Phil Layton
Gale Williamson
Ed Patnaude
Larry Longden
Chad Thibodeau
Boris Kazak
Clarence Sloan

16-bit analog-to-digital (A/D) converters were evaluated for performance and linearity degradation due to the total dose induced shifts in the voltage reference. Test data and analysis of three A/D converters is presented.

Keywords:

Electronic circuit
Analog-to-digital converter
Physics
Linearity
Test data
Converters
16-bit
Voltage reference
Electronic engineering
Voltage
Absorbed dose
Electrical engineering

Correction
Source
Cite
Save
Machine Reading By IdeaReader

References

Citations