Structural and magnetic properties of Mn2.5Ga films

In this work polycrystalline and epitaxial Mn2.5Ga films were prepared by dc magnetron sputtering technique. The lower sputtering power and higher annealing temperature are found to be beneficial for increasing ratio of DO22 phase in the polycrystalline Mn2.5Ga films, leading to the improved magnetic properties although perpendicular magnetic anisotropy (PMA) properties cannot be observed. On the contrary, (001)-oriented epitaxial Mn2.5Ga films grown on Cr buffered MgO substrates possess low saturation magnetization and giant PMA properties simultaneously.