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Degradation mechanism of AlGaN/GaN HEMTs during high temperature operation stress
Degradation mechanism of AlGaN/GaN HEMTs during high temperature operation stress
2018
Y. Q. Chen
X.Y. Liao
C Zeng
C. Peng
Y Liu
R. G. Li
Y. F. En
Y. Huang
Keywords:
Analytical chemistry
Molecular physics
Chemistry
algan gan
Optoelectronics
Condensed matter physics
Degradation (geology)
Correction
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