How to process best gamma spectra of CdTe and CdZnTe detectors

Abstract In this paper, we investigate the use of the real peak shape fitting method to process gamma spectra measured with CdZnTe and CdTe detectors to verify nuclear material and to analyze spectra taken with a X-ray fluorescence (XRF) spectrometer. Results are shown which demonstrate the method in applications connected with the use of CdTe and CdZnTe detectors. It is shown that real shape fitting method gives advantages, in particular, when large low-energetic peak tailings are observed.