Analysis of Calibrated On-Chip Temperature Sensor With Process Compensation for HV Chips

This brief presents a wide-range temperature sensor with process compensation and nonlinear calibration for HV chip thermal monitoring. Due to a high supply voltage and a large current, HV chips are prone to overheating; thus, they require on-chip temperature sensors to monitor thermal variation. The voltage difference between the drain and source voltages of a metal–oxide–semiconductor, i.e., ${V}_{\rm DS} $ , of HV devices is enlarged by high supply voltages, causing a severe channel length modulation effect to jeopardize the linearity of the saturation current. The proposed calibrated temperature sensors in this brief provide a nonlinear calibration function to resolve this problem. Moreover, our design reveals a process compensation capability by the proposed process variation canceler. The maximal deviation in the range of $(-40\ ^{\circ}\hbox{C}, +150)\ ^{\circ}\hbox{C}$ is measured to be $-2.05\ ^{\circ}\hbox{C}$ – $+2.06\ ^{\circ}\hbox{C}$ .