Post-Process Modification of CeOx/C-Supported PtCu Thin Film Catalyst and Its Catalytic Activity for Hydrogen Evolution Reaction

CeOx/C supported PtCu thin film catalysts were prepared by ion beam sputtering (IBS) and subsequently annealed at 400°C under vacuum environment and electrochemically dealloyed. Scanning transmission electronic microscope (STEM) and atomic force microscope (AFM) characterizations show that the surface of post-processed catalyst presents nanoporous structure and has a high root mean square roughness (RMS = 13.9nm). Electrochemical measurements indicate that the post-processed PtCu–CeOx/C catalyst shows higher catalytic activity towards hydrogen evolution reaction than pure Pt/C. While inductively coupled plasma atomic emission spectroscopy (ICP-AES) analysis displays that the platinum (Pt) loading of the post-processed PtCu–CeOx/C is 0.1192mg/cm2, decreasing by 20% compare to pure Pt/C (0.1490mg/cm2). X-ray photoelectron spectroscopy (XPS) analysis confirms that the surface of post-processed PtCu–CeOx/C enrich Pt and analyzes the chemical valence of Pt element using depth profiling technology. It can be in...