Electron-impact ionization cross section of neon ( sigma n+, n=1-5)

Multiple ionization cross sections of neon (Ne-Nen+, with n=1-5) by electron impact have been measured with energies ranging from threshold up to 3000 eV, by a time-of-flight technique. A comparison with other experimental data is presented. The integrated oscillator strengths (Mn+2) for the processes have been determined showing a good agreement with previous reported data.