Synthesis And Structural Studies Of CdTe Thin Films Formed By Vacuum Evaporation Technique

Te/Cd/Te trilayer has been successfully synthesized by using vacuum evaporation technique onto cleaned glass substrate at room temperature under the vacuum of the order of 10−5 mbar. Furnace annealing has been carried out at different temperatures (573 K, 623 K, 673 K and 723 K) in Argon ambient. CdTe compound was evaporated under same conditions for comparison studies. X‐ray diffraction (XRD) studies were done for structural analysis of these as‐deposited and annealed samples. These studies reveal that the phase formations are highly dependent on the annealing temperature. Optical band gap measurements show sharpening of the band edge at 723 K annealing, band gap value were found to lie in the range of 1.45–1.5 eV. X‐Ray Fluorescence (XRF) studies were carried out for elemental analysis of these trilayer.