A UHV Apparatus for Soft X‐ray Spectroscopy with Symmetry Selection for Solids and Surfaces

A UHV apparatus for soft x‐ray spectroscopic studies on solids and surfaces has been constructed at the beamline BL27SU in SPring‐8. A newly developed flat field spectrometer with a CCD detector is equipped for soft X‐ray emission spectroscopy (SXES). The focused beam, less than 10μm in vertical direction, enables us to take entrance slit of the spectrometer away, and to achieve high detection efficiency without loss of incident beam. The energy resolution (E/ΔE) of around 1000 is realized in the energy range of 250–900 eV. An electron energy analyzer is also equipped for photoelectron spectroscopy (PES). An undulator called “Figure‐8” at this beamline supplies both horizontally and vertically polarized soft x‐rays so that we can get symmetry resolved SXES and PES spectra with ease by changing the polarization.