Investigation on Cu-Pb alloys with scanning Kelvin probe microscopy

Inhomogeneous samples prepared by magnetic sputtering were investigated using scanning Kelvin probe microscopy(SKPM),and much of local information,such as surface morphology and surface electrical potential difference induced by inhomogeneous composition distribution has been obtained.Also studied the roughness of Cu particles on the Cu-Pb alloy.This analytical approach neither requires complex sample preparation process nor deforms the sample.For a material system with fixed macroscopic composition and microscopic phase separation,the difference phase distribution could be depicted in visual way by SKPM.And SKPM is able to acquire more local information on nanometer scale.