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Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System
Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System
2012
Maeda Noboru
Fukui Shinji
Ichikawa Kouji
Sakurai Yukihiko
Sekine Toshikazu
Takahashi Yasuhiro
Keywords:
Immunity Testing
Scattering parameters
Control engineering
Engineering
Correction
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