Sputtering yields of tantalum by hydrogen ions in the energy range of 3–11 keV
2019
The total sputtering yield of 6 nm thick polycrystalline tantalum films resulting from H2+ ion bombardment, at normal incidence, has been determined. For this purpose, we study the evolution of the...
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
16
References
1
Citations
NaN
KQI